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Pore Characterization in Low-k Dielectric Films Using X-Ray Reflectivity: X-Ray Porosimetry

Name: Pore Characterization in Low-k Dielectric Films Using X-Ray Reflectivity: X-Ray Porosimetry
Price: 6.01 KWD
Availability: InStock

Product ID: 287271514

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Pore Characterization in Low-k Dielectric Films Using X-Ray Reflectivity: X-Ray Porosimetry

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TrustScore 4.5 | 7,300+ reviews

Ayesha M.

The product exactly matches the description. Very satisfied with my purchase.

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Best international shipping I've ever tried. Worth every penny!

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